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Scanning Probe Microscope based Tools for NanoTechnology
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News

2006

2007 2005


18.10.2006

NT-MDT participates in Austrian-Russian Science Day in Vienna.

În 16-20th of October 2006 NT-MDT Co takes part in Austrian-Russian Science Day:
Bilateral Meeting on Nanosciences and Nanotechnology held in Vienna. The Austrian-Russian Science Day is hosted by the Austrian Federal Ministry of Education, Science and Culture, and the Ministry of Education and Science of the Russian Federation. The event is jointly organized with the Austrian Research Promotion Agency (FFG)and the Austrian Science Fund (FWF).
The purposes of the meeting:
•  Presentation of scientific expertise of Russian and Austrian researchers
•  Information exchange between Russian and the Austrian researchers in the field of nanosciences
• Discussion on bilateral and European research cooperation opportunities
In the framework of the bilateral meeting NT-MDT participates in “ Methods and tools for diagnostic,  measurements and nanomaterials development” workshop where our General Director V.Bykov presents his report devoted to new developments in NT-MDT’s microscope line.
NT-MDT Co maintains active international activity cooperating with the worlds’ biggest research centers and developing international collaboration in nanotechnology area. Our purpose is to demonstrate a high level of nanotechnology development in Russia and find new ways for joint scientific and technical projects realization.

12.09.2006

NT-MDT runs regular annual distributors’ meeting.
On 18-20th of September in Apeldoorn, Netherlands, NT-MDT Co runs its annual distributors’ meeting where more then 20 of our world’s representatives will participate.  The meeting will be held in the office of our European distributor, NTI-Europe company. 
The agenda of the meeting includes company strategy  and discussion of the product line conception, evaluation of the achieved goals, trainings, demonstrations, etc. Traditionally this kind of meetings is considered like very important point  in terms of information and experience sharing, which helps to improve cooperation  between NT-MDT and  the distributors and increase our company share on the world’s market of nanotechnology.
We are waiting our partners on Apeldoorn, September 18-20!

27.07.2006On 17th of July, 2006 NT-MDT quality management system was certificated according to the requirements of ISO 9001-2000.
05.07.2006

NT-MDT with a great honor announces that our NTEGRA Spectra has won an R&D 100 Award which is one of the most prestigious awards in the field of analytical instrumentation! It has  been selected  as one of the 100 most technologically significant products introduced into the marketplace over the past year.

08.06.2006

On 13-15th of June NT-MDT Company will take part in the XXth International Economic Forum held under the Russian Federation President’s patronage.

25.05.2006

New informational and advertising materials on NTEGRA Spectra are available now.
Look at the animated optical scheme and try to switch lasers or gratings by mouse click, scrutinize differences between upright and inverted configurations and enjoy the illustration showing excellent NTEGRA Spectra functionality.

Absolutely unique product!
View presentation (1.5 Mb) with upright setup for simultaneous Raman and AFM micro-imaging of non-transparent samples. Extremely high spatial resolution and Raman collection efficiency make the NTEGRA Spectra in upright configuration to be the only commercial system suitable for TERS on opaque specimens.

16.05.2006

Hereby NT-MDT Co announces a new distribution contract signing up with EDGETECH SCIENTIFIC PVT. LTD. in India region
Distributor agreements between NT-MDT SIMCO GLOBAL TECHNOLOGY & SYSTEMS LTD. are terminated and all obligations in guarantee and post-guarantee service, technical support and sales in India are now undertaken by new exclusive distributors.  We are sure our new partner will make great contribution in  SPMs market  development in India.

11.05.2006

NT-MDT's announced tests completion of new 1 um scanner. This new scanner has a high resonance frequency of piezotube about 17 kHz and allows working without active vibration isolation system. At the same time it has significantly decreased noise and lateral drift compared to 3um scanner.  Atomic resolution can be obtained immediately after the probe’s landing.

12.04.2006

NT-MDT president Dr. V.A. Bykov has been awarded with the highest sign of “National greatness”.

04.04.2006

At March 13-17 NT-MDT took part in X “Nanophysics and Nanoelectronics” Symposium which was held in Nizhny Novgorod.

30.03.2006Successful close-out of European NANOSPIN project’s regular stage.
24.03.2006NT-MDT Co. puts on the market new product – sealed fluid cell with temperature control in -30 +170 C range.
14.03.2006

NT-MDT company has won a privilege to participate in annual «AFM and other scanned microscopes» short courses led by famous Dr. Phillip E. Russell.

13.03.2006

NT-MDT president Dr. V.A. Bykov is awarded by “Community” newspaper with honorary “Business-like co-operation 2005” Diploma.

13.03.2006

Russian-Hungarian international nanotechnology center foundation.

03.03.2006

A senior researcher Belyaev Alexey, an author of many science and research studies, one of the best specialists of our company who contributed a lot into our company development, was awarded with honorary sign “Engineering Glory of Russia” of first degree!

01.03.2006

NT-MDT has new distributors in Taiwan and China - OMEGA Scientific Taiwan Limited and Shanghai AJ Nano-Science Development Co. accordingly. These companies successfully deal with a range of scientific products including SPMs for a long period of time. 
Distributor agreements between NT-MDT and Dual Signaltech Corp; NT-MDT and Beijing Oriental Science and Technology Development Co. are terminated and all obligations in guarantee and post-guarantee service, technical support and sales in Taiwan and China are now undertaken by new exclusive distributors. 

23.01.2006

On 5-9 of December 2005 NT-MDT company organized a seminar "Nanotechnology and atomic force microscopy as a tool of nanotechnology".

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