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Scanning Probe Microscope based Tools for NanoTechnology
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Press-releases

2005

2006  


28.12.2005First Nanotechnology Facility on the NANOFAB platform
On the threshold New Year NT-MDT Co. puts on the market new product – Nanotechnology Facility NANOFAB 100.
16.12.2005NT-MDT Co. was awarded by Holy Alexander Nevsky order in the “Composition for success” nomination!
In October 2005 NT-MDT Co. was awarded by Holy Alexander Nevsky order for its great contribution to nanotechnology development in Russia..
26.09.2005The training center is open on the basis of NT-MDT equipment (Russia) at Eindhoven University of Technology (TU/e), Netherlands
In Eindhoven University of Technology the training program on nanotechnology is successfully realized on the basis of NanoEducator for first-year students.
19.08.2005NT-MDT Quality Management System meets the requirements of ISO 9000 standards
On 29th of July, 2005 NT-MDT quality management system was certificated according to the requirements of ISO 9001-2001 (ISO 9001:2000).
29.06.2005NT-MDT in the space and in Venice on 51st International Art Exhibition / La Biennale di Venezia
Astronaut Roberto Vittori opened the Art Exhibition and spoke about NT-MDT company, Mona Lisa microimage, which is in orbit now, and of cause about nanotechnology achievements.
17.06.2005The NT- MDT project “NTEGRA”– the winner of “Russian Innovation Competition - IV”
NT-MDT project became the winner in section “Success history” and was awarded by the Innovation Premium “Prospect”!
12.05.2005NT-MDT Co. launches a new SCM system to Market.
NT-MDT Co. has developed a unique technique (patent pending) to acquire SCM images and to carry out C-V è dC/dV-V spectroscopic measurements on semiconductor and ferroelectric samples.
29.04.2005The NT-MDT Co. at the world exposition “EXPO-2005” in Japan.
A joint project “Making the Invisible Visible” of the Federal Agency for Science and Innovations and the NT-MDT Co.
15.03.2005NT-MDT Company launches to the market new accessories.
DNA sizes obtained by new DLC tips is close to the real size.
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