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At March 13-17 NT-MDT took part in X “ Nanophysics and Nanoelectronics” Symposium which was held in Nizhny Novgorod. The main objects of Symposium participation was demonstration of scanning probe microscopy’s latest developments to leading Russian scientists and meet them with potentials of new generation SPMs in different surfaces samples researches. For to achieve this goal our specialists managed to lead demo measuring of  polymers, composite materials (nanoceramics), silicon wafers specimens  with  NTEGRA Aura Nano Probe Laboratory obtaining results which demonstrates the highest quality of our product what was noticed by the most participants of demonstration.

During Symposium there were following lectures read: “New potentialities of probe microscopy” by NT-MDT director Victor Bykov; “Effect of local probe amplification of combinative dispersion assisted with cantilevers covered with silver nanoparticles” by NT-MDT commercial director Andrey Shubin what attracted attention of participants with it’s urgency and scientific pithiness.
As a result of Symposium NT-MDT confirmed its Russian nanoelectronics leader status, our booth and interesting lectures attracted attention of many Symposium’s participants and visitors.  

With its scientific efforts and practice NT-MDT does its best to contribute a lot into Russian science development and to raise its competitive capacity on the world market.