About company
News
Press-releases
Products
Techsupport
Distributors
Scan-gallery
Application Notes
SPM techniques
Collaboration
Search

Your choice is granted!

Scanning Probe Microscope based Tools for NanoTechnology
russian | english

home    contacts    ask online!    publications    spm links    request info    job opportunities


Press-releases

17th International Exhibition of Information Technologies

Back


17th International Exhibition of Information Technologies
24.10.2006

On the 26-29th of September NT-MDT took part in the 17th International Exhibition of Information Technologies by the invitation of World Distributed University where the department of new technologies presented a master class and tutorial lectures devoted to programming techniques.

NT-MDT represented intellectual information system (Capital Expert) that attracted high attention of many visitors and announced NT-MDT not only as the manufacturer of Scanning Probe Microscopes and nanotechnology equipment, but also as a developer of intellectual information systems that successfully manage business procedures.

Copyright © 1998-2008, NT-MDT. All rights reserved.
Service Department: bykovav@ntmdt.ru
You are 6 740 738 visitor on this site.