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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe NanoLaboratories: NTEGRA Aura: Configurations

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Description Specification Applications Configurations Parts & Kits

Configuration for contact SCM

This configuration is very usefull for semiconductors investigations. It allows to carry out contact SCM measurements with attofarade precision

   

Configuration for electrochemical processes

The given configuration allows to investigate electrochemical processes. This structure includes AFM electrochemical liquid cell and a preamplifier.

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Configuration for measuring in liquid

Because of scanning by sample this configuration allows high resolution measurements in liquid.

   

Configuration for STM measurements

STM head with preamplifier (30pA-50nA). Open configuration allows easy access to sample-tip area for high aperture laser illumination, etc. Scanning by the sample allows to reach maximal resolution.



Configuration for measurements in vacuum

This configuration allows measurements in low vacuum environment – 10-2 torr with the following advantages. Due to a cantilever Q-factor increase measurements are more sensitive, and they are possible without bad influence of surface adsorbate.

   

Configuration for investigation of magnetic characteristics

This configuration to analyze specimen magnetic properties in a variable external magnetic field by magnetic force microscopy (MFM) in the nanometer scale.


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