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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe NanoLaboratories: NTEGRA Aura: Parts & Kits

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Description Specification Applications Configurations Parts & Kits

Approach systems
SCB14aNTF
Base unit
click to zoom		SCC04NTF
Changeable SPM measuring heads basement
click to zoom
Measuring heads and scanners
SC100NTF
Replaceable scanner
click to zoom		SC201NTF
1 um scanner
click to zoom		SF005NTF
Universal SPM head for NTEGRA
click to zoom		SFV150NTF
AFM scanning head
click to zoom


Measuring heads and scanners
ST007NTF
STM
click to zoom
Adjustment Units
AU020NTF
Adjustment unit for low current measurements
click to zoom		AU030NTF
Adjustment unit for contact SCM
click to zoom
Heating stages
SU005NTF
Heating stage
click to zoom
Special devices
CSM01
Cooler
click to zoom		EMF04NTF
Electromagnet
click to zoom


Special devices
MP4EC
Electrochemical cell
click to zoom
Electronics
BL222RNTF
SPL Workstation
click to zoom		IN005
Interface board
click to zoom
Vibration and acoustic isolation systems
AC007NTF
Protective cover
click to zoom		TS-150
The dynamic vibration isolation system
click to zoom
Optical systems
ÑÑBC1
Color CCD camera
click to zoom

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