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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe NanoLaboratories: NTEGRA Maximus: Description

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Automatized SPM system

NTEGRA Maximus datasheet (1 MB)

 

   NTEGRA Maximus basement is a changeable center unit with a motorized stage. Sample movement is possible within 50mm by X,Y and within 0-360 degrees under rotation.
   Automated measurements of many small samples are also possible with NTEGRA Maximus enabling high throughput screening.
   Macro language tool included in the base system provides highest possible flexibility in a research procedure selection and tuning.
   Scanning AFM head with capacitive sensors gives the system metrological properties.


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