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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe NanoLaboratories: NTEGRA Solaris: Description

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Nearfield optical SPM system

NTEGRA Solaris datasheet (650 KB)

 

 

   New Shear Force head design offers:

  • 100x100x10 um scan range
  • High scanning linearity owing to integrated position sensors
  • Easy-to use Reflection mode realization

   The integrating of the inverted microscope objective into the central base because of high mechanical rigidity provides stability of the system making quality images and long-term experiments possible.

    Reflection and  Transmission modes are  available.


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