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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe NanoLaboratories: NTEGRA Spectra: Description

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Description Specification Applications Configurations Parts & Kits
Operation principle          

Raman spectroscopy AFM system    

NTEGRA Spectra description and applications   (3.1 Mb)
NTEGRA Spectra datasheet   (1.2 Mb)

 

 

Inverted microscope configuration   (1.5 Mb)
(for transparent samples)

Upright microscope configuration   (0.8 Mb)
  (for opaque samples)

Contact
Mr. Andrew B. Shubin
- VP Marketing
E-mail: shubin@ntmdt.ru;
Tel.: +7 495 913-57-36/37/38
Fax: +7 495 913-57-39
Mobile: +8 916 678-62-00.

NTEGRA Spectra
system has won prestigious R&D 100 Award!

 

   The universal PNL platform provides the possibility to integrate scanning confocal scheme in combination with regular AFM and spectrometer to detect Raman scattering spectrum. This spectra may then be interpreted into complex information concerning chemical composition of the object.

   Substantially extending optical microscope and AFM possibilities laser equipped system would be indispensable in environmental sciences, material sciences, living cell investigations.

More detailed description see in
"Focus on Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging".  Nanotechnology 18 (2007) 315502. (pdf,  1.7 Mb)
"Tip-enhanced Raman Spectroscopy and Imaging". Imaging & Microscopy v. 9 (2007) p. 56. (pdf,  2.6 Mb)


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