This configuration allows to realize investigations of biological objects, quality control of optical components surfaces and radiating semiconductor structures, of nanooptical’s and integrally-optical elements parameters, particularly quantum dots spectrums.

This unique configuration allows optical control of the sample surface with 0.4 mkm resolution at that owing to high aperture objective one can to see sample surface underneath the cantilever.

Configuration that include AFM head besides the standard set of force measurement modes allows to implement optical modes with resolution below diffraction limit, such as spectral ones concerned with enormous nonlinear effects. In particular, this can be measurements which use Enormous Combinational Scattering effect, also known as Tip-Enhanced Raman Spectroscopy.

This configuration, with the aid of using scanning-by-sample technique, allows to realize AFM measurements with maximal resolution and minimal distortions.