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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver NEXT: Description

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Specification


SPM Solver NEXT 










Solver NEXT brochure

 Solver NEXT is a multifunctional general-purpose Scanning Probe Microscope with digitized control. Distinguished for its high automation degree, wide range of SPM modes, the microscope belongs to the state-of-the art generation of instruments. Ease-of-operation for an inexperienced user is provided by automated alignment of the reading system laser – cantilever – photodiode sensitive to position.

 The essential design features of the Solver NEXT are its two built-in measuring SPM heads (AFM and STM) with the automated positioning on the sample. The design also supports manual insertion of additional measuring heads, currently these are the heads for liquid-environment and nanosclerometric measurements. The sample can be heated up to 130 îÑ.

 The video monitoring system enables high resolution, motorized focusing, and continuous zooming. Selection of the scan area is motorized as well. Sample positioning is automatically related to movement of the video monitoring system thus enabling to bring the chosen sample area automatically to the SPM measurement area..

   Measuring modes
  • In ambient air:
    STM/ STS/ AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ Kelvin mode/ Adhesion Force Imaging/ AFM Lithographies: Force (scratching + dynamic plowing), Current (Local Anodic Oxidation), STM
  • In liquid:
    AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Imaging/ AFM Lithography
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