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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver LS: Description

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SPM system  Solver LS 

Solver LS is a cutting-edge solution not only for scientific research, but also for production monitoring. With this sophisticated tool you can investigate and control samples (wafers) with the size up to 250mm (300mm optional) in diameter and 15mm thick. The motorized positioning stage and optical viewing system, which are included in Solver LS, allow you to choose any place visually and define a number of areas in different parts of the sample to be scanned automatically. Due to a great number of features Solver LS is abundantly given, the range of application is almost endless.

   Features

  • Thanks to software adjustment of operational modes and functional scheme of the unit, electrical circuit switching can be done without program re-installation.
  • The option to save settings in different files allows the user to employ almost all modern methods of scanning probe microscopy.
  • An experienced user can develop and implement his or her own techniques including multi-pass ones.

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