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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver SNOM: Configurations

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Description Specification Applications Configurations Parts & Kits

DualScan AFM configuration

This unique configuration extends the conventional scanning range to 100x100 mkm. In this case only several AFM methods are available.

   

Ņonfiguration for optic measurements

This configuration may be used for investigation of cellular creations, molecule of DNA, viruses , property of semiconductors , for obtaining structures with characteristic scale about 1/10 wavelength , for realization of spectroscopy of biological, for observation of process of chemical reaction.


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