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Technical specification: |
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SNOM Operation |
Reflection (probe induces the light on the surface, special objective Reflection Mode with the use of inverted microscope optical scheme), Transmission, Shear Force |
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Photodetectors |
PMT (Hamamatsu) |
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Lasers |
532 nm, 10 mW;
Multi line: 514nm/55mW, 488nm/55mW, 476nm/7mW, 465nm/7mW, 457nm/5mW , 150mW;
semiconductor Extra input for external laser |
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Scan type |
By Probe |
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X,Y sample positioning |
30x30mm (within 30mm circle) |
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Fine tip positioning |
4x4mm with 5um resolution |
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Sample Substrate |
Coverslips, standard slides and other flat samples up to 75x25mm
Petri dishes 35-45mm and 55-60mm |
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Inverted Optical Microscope |
Own optical scheme for Olympus IX-70(50), Biolam-P (optional) |
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Probes |
Red and Green, aperture <100nm |
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Control System |
SPM Controller |
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Vibration Isolation |
Passive isolation is integrated
Active anti-vibration system is available by request |
contacts
