Stand Alone SMENA expands the scope of SPM to bring you innovative facilities for investigating samples with unlimited size in all available SPM measuring modes. In spite of such versatile measuring capabilities Stand Alone SMENA has a very compact low weight design and reasonable price. SPM Smena consists of a stand-alone measuring head and an electronic module connected to a laptop or PC by the mean of interface board.
Stand Alone SMENA device with electronics block (reverse view) and computer
To find easier a place on your sample surface in which you want to start your measurement, we really recommend you to use the specially selected optical viewing system. This system will really help you to adjust your AFM as well as to view the cantilever and the sample surface with the resolution of 5µm, while the eye-glass of the optical microscope stays fixed in the vertical position (by means the special adjustable mirror). You can also view the image obtained by the CCD camera on the black&white or color monitor.
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XY manual positioning stage |
There are some cases when it's impossible to use SMENA head for large samples investigation as stand alone device. For instance, when the sample surface is too fragile or sensitive. Or when the rigidity the sample in the scanning field can't be provided (i.e. for such soft samples like textiles or leather). Now we have the solution for these cases.
 Measuring modes
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In air: Contact AFM/ LFM/ ResonantMode AFM (semicontact + noncontact)/ Phase Imaging/ Force Modulation (viscoelastisity)/ Adhesion Force Imaging/ Spreading Resistance Imaging/ SCM/ SKM/ MFM/ EFM/ AFM, Voltage, RM Lithographies
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In liquid: Contact AFM/ LFM/ ResonantMode AFM (semicontact + noncontact)/ Phase Imaging/ Force Modulation (viscoelastisity)/ Adhesion Force Imaging
Applications
Optical and Magnetic Storage, Coating and Polishing Quality Control, Large Optics, Polymers, Biology and Medicine, Semiconductors, Materials Science and many others.
Highlights
- Mobile, portable, compact AFM;
- Compatible with notebooks;
- Easy to upgrade;
- Advanced piezo scanner;
- The lowest noise level (RMS<1A in vertical (Z) direction);
- A wide range of SPM techniques;
- Very low power consumption (less than 60W);
- 22-bit composite DAC controller and DSP options;
- Easy access to almost any internal signals;
- EC option;
- Compatible with almost any leading manufacturers' cantilevers;
- Powerful software;
More options
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Easy mounting on an inverted optical microscope Olympus IX-70 using our rigid stage.
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You can upgrade your SMENA to the complete Solver P47H-PRO system just ordering additional components. -
High-resolution sample translation provided by Closed-Loop XY Stage (0,1% non-linearity).
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Specification |
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Sample Size |
Unlimited
Note: Small samples (up to 100x100x20mm) can be placed between the SMENA head legs. |
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Scanners |
50x50x2.5µm; 100x100x5µm |
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Min. Scanning Step |
0.006nm; 0.012nm |
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Scan Type |
By Probe |
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Sample positioning range |
5x5mm |
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Positioning resolution |
5µm |
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Optical viewing system |
Numerical aperture 0.1
Magnification 58x to 578x
Horizontal field of view 2 to 0,51mm |
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Control System |
SPM Controller |
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Vibration Isolation |
Passive vibration isolation is available by request;
Active anti-vibration system is available by request | |
contacts
