Measuring modes

• In ambient air:
  STM/ STS/ AFM (contact + noncontac + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ Kelvin mode/ Adhesion Force Imaging/ AFAM/ AFM Lithographies: Force (scratching + dynamic plowing), Current (Local Anodic Oxidation), STM
• In liquid:
  AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Imaging/ AFM Lithography

    Applications

• Biology and Biotechnology
  Proteins, DNA, viruses, bacteriums, tissues
• Materials Science
  Surface morphology, surface morphology, local piezoelectric properties, local adhesion properties, local tribological properties
• Magnetic materials
  Magnetic domain structure visualization, observation of magnetization reversal processes that depend on external magnetic field, observation of magnetization reversal processes under different temperatures
• Semiconductors, electric measurements
  Wafers and other structures morphology, local surface potential and capacitance measurements, electric domain structure imaging, determination of heterojunction bounds and semiconductor regions with different doping levels, failure analysis (localization of conductor line failure and leakage in dielectric layers)
• Polymers and Thin Organic Films
  Spherulites and dendrites, polymer monocrystals, polymer nanoparticles, LB-films, thin organic films 
• Data storage devices and medias
  CD, DVD disks, storages for terabit memories with thermomechanical, electric and other types of recording
• Nanomaterials
  Nanopowders, nanocomposites, nanoporous materials
• Nanostructures
  Fullerenes, nanotubes, nanofilaments, nanocapsules 
• Nanoelectronics
  Quantum dots, nanowires, quantum structures 
• Nanomachining
  AFM lithography: force (ac and dc), current (Local anodic oxidation), STM lithography 
• Nanomanipulations
  Contact force