Solver PRO is a powerful instrument for the investigation of new materials, thin films, polymers, semiconductors, biological samples and for any other applications which require atomic or molecular resolution in air, gas or fluid environments, as well as in-situ examination of structural changing on the sample surface during heating.

   The Solver PRO Scanning Probe Microscope is NT-MDT's newest development in the field of instrument-making, incorporating the latest technological know-how in scanning probe microscopy. Solver PRO is absolutely versatile due to its functionality and measuring capabilities, but at the same time it is very easy to use. This unique instrument will open up new horizons for the thorough investigation of different kinds of samples, delivering resolutions on the atomic/molecular scale in air, gas and liquid environments as well as the opportunity to use almost any known scanning probe microscopy technique. Moreover, you may heat the sample up to 150C (heating up to 300C is possible in a different system configuration) and observe structural changes on the sample surface.

   The modular system design is unique too, because it allows you to configure the instrument for your own application. For instance, the original construction of the Solver PRO base unit provides a simple procedure of scanners replacement, set up of the sample holder, AFAM module, heating stages and so on depending on the experimental requirements. The tip to sample approach procedure is automated, but doesn't exclude manual operation to speed up the preparation for the experiment. Furthermore, due to the base unit construction it is possible to mount any type of atomic force (AFM), scanning tunneling (STM) and shear force measuring heads. The scanning range may vary from 1.3 to 15 microns along Z direction, and from 3 to 150 microns along XY.

   The unique feature of the Solver PRO is that you may increase the scan range in the horizontal dimension (XY) up to 150 um and/ or in he vertical dimension (Z) up to 7.5um using simultaneously the scanning-by-sample and scanning-by-probe configurations (DualScanTM mode). Moreover, it is even possible to increase the scan range in the vertical dimension (Z) up to 15um using both scanning configurations and CLE.

   Hence, the Solver PRO brings together the whole series of scanning probe microscopes in a single platform, providing all of the major SPM techniques. Its state-of-the-art design and powerful software, which can be easily set up for any measuring technique, will substantially reduce the time required to thoroughly examine the sample and obtain full and accurate information about the sample properties, i.e. surface topography, magnetic and electric field distribution, local hardness and elasticity (including Young's modulus calculation), friction forces, adhesion etc.