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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver PRO: Specification

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Description Specification Applications Configurations Parts & Kits


Scan type

Parameter

Scanning by sample

Scanning by probe

Sample size

Up to 40x10 mm

Up to 12x12x2 mm with the liquid cell use

Up to  100x20 mm and unlimited for measuring head used for stand alone operation

Scanners

3x3x1.3 um (±10%)
optional: 10x10x2 um (±10%)
50x50x2.5 um (±10%)

50x50x5 um (±10%)
optional: 100x100x3.5 um (±10%)

Min. scanning step (DAC)

0.0004 nm; 0.0011 nm; 0.006 nm

0.01 nm; 0.006 nm; 0.0015 nm

SPM heads

 

AFM
STM: 30pA-50nA, RMS noise 4pA (standard preamplifier);

AFM
optional: Shear Force scanning head

Optical viewing system

Resolution
Numerical aperture
Magnification with CCD
Horizontal field of view

3 um
0.1
47x to 578x
6,1 (2) to 0,49 mm

XY sample positioning

5x5 mm

Positioning resolution

5 um

Heating

130 C

Temperature stability

0.1 C

Voltage supply

90-240 V, 50-60 Hz

Power

60 W

Fully software controlled device

Vibration isolation

Active vibration isolation system
Electric shielding and acoustic isolation is provided by the special cast metal hood


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