Measuring modes

• In ambient air: STM/ STS/ Contact AFM/ LFM/Semicontact AFM/Noncontact AFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ SKM/ Adhesion Force Imaging/ Shear force/ AFM (Force + Voltage) Lithography, STM Lithography, RM Lithography.
• In liquid: Contact AFM/ LFM/ Semicontact AFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Microscopy/ AFM (Force) Lithography.

    Applications

• Materials Science
  Surface morphology, local piezoelectric properties, local adhesion properties, local tribological properties.
• Nanomanipulation
  Contact force.
• Nanolithography
• Semiconductors
  Wafers and other structures morphology, local surface potential and capacitance measurements, electric domain structure imaging, determination of heterojunction bounds and semiconductor regions with different doping levels, failure analysis (localization of conductor line failure and leakage in dielectric layers).
• Spectroscopy
• Optical and Magnetic Storage Development
  CD, DVD disks, storages for terabit memories with thermomechanical, electric and other types of recording.
• Medicine and Biology
  Proteins, DNA, viruses, bacteriums, tissues.
• Polymers and Thin Organic Films
  Spherulites and dendrites, polymer monocrystals, polymer nanoparticles, LB-films, thin organic films.