SPM Solver P47H-PRO features its versatility. The number of available measurement and influence methods and modes is huge. Scanning-by-probe scheme allows characterization of samples with sizes up to 100x100x20mm There are varieties of the model for measurements in controlled gas environment, in liquids, with sample heating up to 300°C.
The AFM head can be easily removed for Stand Alone operation.
 Measuring modes
Applications
Materials Science, Nanomanipulation, Nanolithography, Semiconductors, Spectroscopy, Optical and Magnetic Storage Development, Thin Films, Medicine and Biology, Polymers.
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Technical specification |
| Sample size |
100x100x20mm |
| Scanners |
50x50x2.5 µm (±10%);
100x100x5 µm (±10%);
12x12x1.5 µm (±10%) (for STM only);
80x80x3.5 µm (±10%) (for Shear Force only) |
| Min. Scanning Step |
0.006 nm; 0.012 nm; 0.0015 nm, 0,009nm |
| Scan Type |
By Probe |
| SPM Heads |
AFM;
STM: 30 pA - 50 nA, RMS noise 4 pA;
Shear Force |
| Optical viewing system |
Numerical aperture 0.1
Magnification 58x to 578x
Horizontal field of view 2 to 0,51mm |
| Control System |
SPM Controller |
| Vibration Isolation |
Passive isolation is integrated
Active anti-vibration system is available by request | |
contacts
