|
|
Microscope |
|
Parameter
|
P47-PRO
|
P47H-PRO |
|
Sample size
|
Up to 40x40x10mm |
Up to 100x100x20mm and unlimited for measuring head used for stand alone operation |
|
Scanners |
3x3x1 um (±10%); optional: 10x10x2 um (±10%), 50x50x3 um (±10%) |
50x50x2.5 um (±10%); 100x100x5 um (±10%); 12x12x1.5 um (±10%) (for STM only); 80x80x3.5 um (±10%) (for Shear Force only) |
|
Min. scanning step (DAC) |
0.0004 nm; 0.0011 nm; 0.006 nm |
0.006 nm; 0.012 nm; 0.0015 nm; 0.009nm |
| Scanning Type |
by Sample |
by Probe |
|
SPM Heads |
AFM STM: 30pA - 50nA, RMS noise 4 pA (standard preamplifier), 10pA - 5nA, RMS noise 1.5 pA (low current preamplifier) Shear Force |
AFM; STM: 30 pA - 50 nA, RMS noise 4 pA; Shear Force
|
|
Optical viewing system |
Resolution 3 um Numerical aperture 0.1 Magnification with CCD 58x to 578x Horizontal field of view 5,1 (2) to 0,51mm |
|
Control System
|
SPM Controller |
|
Vibration Isolation |
Passive isolation is integrated Active anti-vibration system is available by request |