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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver: Specification

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Description Specification Applications Configurations Parts & Kits


Microscope

Parameter

P47-PRO

P47H-PRO

Sample size

Up to 40x40x10mm

Up to  100x100x20mm and unlimited for measuring head used for stand alone operation

Scanners

3x3x1 um (±10%);
optional: 10x10x2 um (±10%),
50x50x3 um (±10%)

50x50x2.5 um (±10%);
100x100x5 um (±10%);
12x12x1.5 um (±10%) (for STM only);
80x80x3.5 um (±10%) (for Shear Force only)

Min. scanning step (DAC)

0.0004 nm; 0.0011 nm; 0.006 nm

0.006 nm; 0.012 nm; 0.0015 nm;  0.009nm

Scanning Type by Sample by Probe

SPM Heads

AFM
STM: 30pA - 50nA, RMS noise 4 pA (standard preamplifier),
10pA - 5nA, RMS noise 1.5 pA (low current preamplifier)
Shear Force

AFM;
STM: 30 pA - 50 nA, RMS noise 4 pA;
Shear Force

Optical viewing system

Resolution  3 um
Numerical aperture  0.1
Magnification with CCD  58x to 578x
Horizontal field of view  5,1 (2) to 0,51mm

Control System

SPM Controller

Vibration Isolation

Passive isolation is integrated
Active anti-vibration system is available by request


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