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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver EC: Specification

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Description Specification Applications Configurations Parts & Kits

Solver EC specification

Bipotentiostat/galvanostat  
Output Compliance Voltage:
Voltage Scan Range:
Current Ranges:
Reference Input Impedance:

± 15 V
± 4 V (stability ± 1 mV)
±5mA; ± 100 uA; ± 2 uA (accuracy of measurement ±0.1 % of the range)
> 1011 Om

Modes: manual; sweep (1 mV/s to 100 mV/s), pulse (time resolution 10 ms); potentiostatic current transients; cyclic and linear voltammetry; universal programmer.
Computer:
System:

Pentium II or higher.
Windows 98/XP

EC Cell  
Material: :
Max size:
Volume of electrolyte:

Teflon
35x10 mm
0.5 to 1.5 ml

EC STM Head  
Scanner: 3x3x1.5 um  (12x12x1.5 um), STM tips holder
Preamplifier:

± 50 nÀ, noise 3 pÀ.

Tips

 

Material:
Diameter
Tip length
Isolated part length
Insulation:
W, Pt-Ir (10-25%)
0.4-0.5 mm;
up to 20 mm,
5-7 mm.
Insulation: Apiezon Wax.
Electrodes
Working:

disks 4-15 mm (Au (111), Pt (111), HOPG, polished polycrystalline metals)

Counter:

Cu-wire, Pt-wire, Au-wire 

Reference:

Cu-wire, Pt-wire, Au-wire, Ag/AgCl (Cypress system)

Electrolyte

H2SO4 (0.01 M) + CuSO4 (0.01 M)

System of inert atmosphere ensuring

nitrogen, argon

 Acceptance test

Underpotential deposition of Cu on Au (111);
Electrodeposition of Cu on Au (111), Pt (111), HOPG.


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