Measuring modes

• In ambient air:
  STM/ STS/ AFM (contact + noncontac + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ Kelvin mode/ Adhesion Force Imaging/ AFAM/ AFM Lithographies: Force (scratching + dynamic plowing), Current (Local Anodic Oxidation), STM
• In liquid:
  AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Imaging/ AFM Lithography

   Applications

• New materials
• Thin films
• Polymers
• Semiconductors
• Biological samples
• Any other applications which require atomic or molecular resolution in air, gas or fluid environments, as well as in-situ examination of structural changing on the sample surface during heating.