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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver PRO-M: Configurations

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Description Specification Applications Configurations Parts & Kits

DualScan AFM configuration

This unique configuration extends the conventional scanning range to 200x200 mkm, by scanning a probe and a sample concurrently, at that reach all basic AFM methods.

   

Configuration for STM measurements

STM head with preamplifier (30pA-50nA). Open configuration allows easy access to sample-tip area for high aperture laser illumination, etc. Scanning by the sample allows to reach maximal resolution.



Configuration for measuring in liquid

This configuration is used for applications in Life Science and it has wide capability to carry out measurements in liquid environments.

   

Ņonfiguration for optic measurements

This configuration may be used for investigation of cellular creations, molecule of DNA, viruses , property of semiconductors , for obtaining structures with characteristic scale about 1/10 wavelength , for realization of spectroscopy of biological object (as a rule with help of UV radiation) , for observation of process of chemical reaction.



Configuration for high resolution AFM

In this configuration scanning is carried out by the sample. It allows to reach maximal resolution and minimal distortions.

   

Atomic Force Acoustic Microscopy configuration

This configuration realizes Atomic Force Acoustic Microscopy. It is very useful for material science applications and allows to measure local values of Young's modulus.


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