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Scanning Probe Microscope based Tools for NanoTechnology
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Scanning Probe Microscopes: Solver PRO-M: Specification

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Description Specification Applications Configurations Parts & Kits

 

Parameters

Type of scanning

Scanning by sample

Scanning by probe

Sample size

Up to 40x40õ10 mm 
Up to 12x12x2 mm  
with the liquid cell use

Up to 100x100õ20 mm and unlimited for measuring head used for stand alone operation

Scanners

3x3x2.6 um (±10%);
10x10x4 um (±10%),
50x50x5 um (±10%)

50x50x5 um (±10%);
100x100x7 um (±10%);
100x100x10 um (±10%) (only for Shear Force)

Min. scanning step(DAC)

0.0004 nm;
0.0011 nm;
0.006 nm

0.006 nm;
0.012 nm;
0.012 nm

SPM heads

 

AFM 
STM: 30 pA-50 nA, RMS noise 4 pA 
         (standard preamplifier);
        10 pA-5 nA, PMS noise 1.5 pA 
        (low current preamplifier)

AFM
Shear Force 

Optical viewing system

Resolution
Numerical aperture  
CCD
Horizontal field of view

1 um
0.28
îò 230x äî 2900x
îò 1.2 äî 0.1 mm

XY sample positioning

5õ5 mm

Positioning resolutin

readable resolution-5 um
sensitivity-2 um

Heating

130 Ñ

Vibration isolation

Active vibration isolation system:
Active damping (0.6-100 Hz),
>100 Hz - passive damping
Electric shielding and acoustic isolation is provided by the special cast metall hood


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