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Scanning Probe Microscope based Tools for NanoTechnology
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SPM techniques

Principles

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STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

AFM
dc Contact techniques
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Contact Scanning Capacitance Microscopy
ac Contact techniques
Force Modulation mode
Contact EFM
AFAM
AFAM Resonance Spectroscopy
Piezoresponse Force Microscopy
Semicontact techniques
Semicontact mode
Phase Imaging mode
Semicontact Error mode
Non-Contact techniques
Non-Contact mode
Frequency Modulation mode
Many-pass techniques
EFM
Scanning Capacitance Microscopy
Kelvin Probe Microscopy
DC MFM
AC MFM
Dissipation Force Microscopy

Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

SNOM
Shear Force Microscopy
Transmission mode
Reflection mode
Luminescence mode
SNOM Lithography

aSNOM techniques
Scanning Plasmon Near-field Microscopy

Lithographies
AFM Oxidation Lithography
STM Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing

Confocal Microscopy techniques
Laser mode
Image mode
Spectral mode
Confocal Volume Lithography
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