Images of the surface relief of ferroelectric PZT thin film prepared by sol-gel method and crystallized from amorphous state by rapid thermal annealing (RTA) procedure. One can see coexistence of conventional and rosette-type crystalline grains. Upper and bottom images are topography and deflection signals respectively obtained in contact atomic force microscopy mode. Images were obtained by Dr. Dmitry Kozodaev, NT-MDT.
Sample courtesy of Prof.   Vladimir Shur, Laboratory of Scanning Probe Microscopy, Ural State
  University, Ekaterinburg, Russia. (labfer.usu.ru)