AFM image of multiple epitaxially grown GaAs layers on Silicon substrate.

3x3 median averaged images. The result is concerned with critical resolution, since it was acquired with a 79 um piezo scanner, and the microscope was placed at the first (not ground!) floor of a building, without antivibration control devices.

Acquired by Marco Salerno.
Sample courtesy Vittorianna Tasco, INFM-NNL Lecce, Italy.