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NTEGRA Spectra NTEGRA Spectra – AFM-Raman-SNOM system. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM SPECTRUM SPECTRUM - Automated AFM-Raman-SNOM system for a wide range of applications

NTEGRA Spectra

Interdisciplinary research at the nanometer scale:
AFM + Confocal Raman + SNOM + TERS
NTEGRA Spectra – AFM-Raman-SNOM system. NT-MDT – AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM
NTEGRA Spectra Brochure (8 Мб)
Overview Working principle TERS probes Applications Specifications Downloads Contact Us
 

Integration of SPM and confocal microscopy/Raman scattering spectroscopy. Owing to Tip Enhances Raman Scattering it allows carrying out spectroscopy/microscopy with up to 10 nm resolution.

NTEGRA Spectra - AFM / CONFOCAL RAMAN & FLUORESCENCE / SNOM / TERS

Integration: The key to the new sciences
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform. more info

Different configuration of AFM with confocal Raman/Fluorescence microscope

Upright

A unique configuration for simultaneous AFM - Raman - TERS* and SNOM imaging of opaque samples

*TERS: Tip Enhanced Raman Scattering, Tip Enhanced Fluorescence etc.

Inverted

Optimized for simultaneous AFM - Raman - TERS* and SNOM imaging of samples on transparent substrates (living cells, nanoparticles etc.)

*TERS: Tip Enhanced Raman Scattering, Tip Enhanced Fluorescence etc.

Side illumination option

Used to facilitate TERS* measurements on opaque samples

*TERS: Tip Enhanced Raman Scattering, Tip Enhanced Fluorescence etc.

Fiber Scanning Near-field Optical Microscopy (SNOM)

SNOM techniques based on on quartz fiber.


 

Cantilever Scanning Near-field Optical Microscopy (SNOM)

SNOM techniques based on cantilevers with aperture.


•     Atomic Force Microscopy ( > 30 modes )
•     Confocal Raman / Fluorescence / Rayleigh Microscopy
•     Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
•     Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)
New era of integration 
Optical AFM (NT-MDT) + Raman spectrometer (Renishaw) = Join the best technologies in one system


HybriD Mode™
Ntegra Spectra equipped with new electronics and software allows to combine a recently developed innovative HybriD Mode™ (HD-AFM™ Mode) for nanomechanical proprieties and Raman for chemical imaging of exactly the same area within single measurement session.

       

Stiffness of HDPE/LDPE polymer sandwich cut by microtome

 

Overlap of Raman maps: HDPE (red), LDPE (blue)

 

AFM topography

Image size: 34 × 34 μm
Data from: M. Yanul, S. Magonov, P. Dorozhkin, NT-MDT.

 


 

 
 
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