|TITANIUM||AFM - Raman - SNOM||Bio AFM||Modular AFM||Automated AFM||Practical AFM|
AFM + Confocal Raman + SNOM + TERS
|Overview||Working principle||TERS probes||Applications||Specifications||Downloads||Contact Us|
Integration of SPM and confocal microscopy/Raman scattering spectroscopy. Owing to Tip Enhances Raman Scattering it allows carrying out spectroscopy/microscopy with up to 10 nm resolution.
NTEGRA Spectra - AFM / CONFOCAL RAMAN & FLUORESCENCE / SNOM / TERS
Integration: The key to the new sciences
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform. more info
Different configuration of AFM with confocal Raman/Fluorescence microscope
• Atomic Force Microscopy ( > 30 modes )
• Confocal Raman / Fluorescence / Rayleigh Microscopy
• Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
• Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)
New era of integration
Optical AFM (NT-MDT) + Raman spectrometer (Renishaw) = Join the best technologies in one system
Ntegra Spectra equipped with new electronics and software allows to combine a recently developed innovative HybriD Mode™ (HD-AFM™ Mode) for nanomechanical proprieties and Raman for chemical imaging of exactly the same area within single measurement session.
Stiffness of HDPE/LDPE polymer sandwich cut by microtome
Overlap of Raman maps: HDPE (red), LDPE (blue)
Image size: 34 × 34 μm
Data from: M. Yanul, S. Magonov, P. Dorozhkin, NT-MDT.
Contact: Dr. Pavel Dorozhkin, Head of Applications and Product Development, email@example.com