SOLVER platform: SOLVER Nano
SOLVER Nano – Modular AFM / STM System
| Full range of standard scanning techniques: |
Contact and semicontact AFM modes, EFM, MFM, Kelvin mode, SCM,
spreading resistance imaging et al. |
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Easy-to-adjust:
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Special chips with alignment grooves provides fixed AFM probe placing in measuring head. This feature reduces the detection system adjusting procedure just to fine tuning of the system in accordance with the particular cantilever properties. |
| Compact rigid design: |
Provides operation reliability and high immunity to environmental loads. |
| Automatic setting of scanning parameters: |
Digital controller with adjustable proportional–integral–derivative feedback guaranties the high quality of imaging. |
| Metrological scanning accuracy: |
Universal closed loop scanner provides maximum scan size 100x100 um and atomic resolution possibility obtaining on nanometer size scans. |
| Comprehensive sofrware: |
Simultaneous up to 8 signals under scanning and up to 3 signals
under spectroscopy. |
