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SOLVER platform: SOLVER PRO-M
Measuring modes
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In ambient air:
STM/ STS/ AFM (contact + noncontac + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ Kelvin mode/ Adhesion Force Imaging/ AFAM/ AFM Lithographies: Force (scratching + dynamic plowing), Current (Local Anodic Oxidation), STM
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In liquid:
AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Imaging/ AFM Lithography
Applications
- New materials
- Thin films
- Polymers
- Semiconductors
- Biological samples
- Any other applications which require atomic or molecular resolution in air, gas or fluid environments, as well as in-situ examination of structural changing on the sample surface during heating.
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