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SOLVER platform: SOLVER P47H-PRO

Measuring modes

  • In air: STM/ STS/ Contact AFM/ LFM/Semicontact AFM/Noncontact AFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ SKM/ Adhesion Force Imaging/ Shear force/ AFM (Force + Voltage) Lithography, STM Lithography, RM Lithography/
  • In liquid: Contact AFM/ LFM/ Semicontact AFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Microscopy/ AFM (Force) Lithography 

Applications

  • Materials Science
  • Nanomanipulation
  • Nanolithography
  • Semiconductors
  • Spectroscopy
  • Optical and Magnetic Storage Development
  • Thin Films
  • Medicine and Biology
  • Polymers.
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