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DualScan AFM configuration
This unique configuration extends the conventional scanning range to 200x200 mkm.
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Atomic Force Acoustic Microscopy configuration
This configuration realizes Atomic Force Acoustic Microscopy. It is very useful for material science applications and allows to measure local values of Young's modulus.
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Configuration with High Resolution Viewing
This unique configuration allows optical control of the sample surface with 0.4 mkm resolution at that owing to high aperture objective one can to see sample surface underneath the cantilever.
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Configuration for contact SCM
This configuration is very usefull for semiconductors investigations. It allows to carry out contact SCM measurements with attofarade precision.
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Configuration for high resolution AFM
In this configuration scanning is carried out by the sample. It allows to reach maximal resolution and minimal distortions.
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Configuration for measuring in liquid
Because of scanning by sample this configuration allows high resolution measurements in liquid.
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Configuration for STM measurements
STM head with preamplifier (30pA-50nA). Open configuration allows easy access to sample-tip area for high aperture laser illumination, etc. Scanning by the sample allows to reach maximal resolution.
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Configuration for hightemperature measurements
This configuration allows to carry out measurements with heating the sample up to 300 C with 0.05 C stability of temperature maintenance.
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