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Configuration for optic measurements
This configuration destines for measurements of surfaces sample relief and his optic near – sufaces characteristics.
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Configuration that include AFM head
Configuration that include AFM head besides the standard set of force measurement modes allows to implement optical modes with resolution below diffraction limit, such as spectral ones concerned with enormous nonlinear effects. In particular, this can be measurements which use Enormous Combinational Scattering effect, also known as Tip-Enhanced Raman Spectroscopy.
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