NTEGRA platform: NTEGRA Prima

General information Key features Technical characteristics Applications Optional features Configurations Information brochure (566.09 Kb)

• closed loop control with the lowest noise level (can be used for scanning fields of <100 nm)
• optical microscope with the resolution of 1µm
• scanning by sample (the lowest noise level, the best resolution on the small fields), scanning by probe (maximum scanning range, working with large samples)
• more than 40 measuring modes, including unique ones
• carrying out experiments in air, in liquids, in controlled environment
• possibility of expanding functionality