SOLVER platform: SOLVER NEXT

General information Key features Technical characteristics Special application Video presentation Information brochure (1.00 Mb)

• HeadHiPEX™ (Head High Precision Exchange) system is intended for measuring head management. HeadHiPEX™ is a completely automated system able to change built-in and external measuring heads maintaining their position under the sample with very high precision
• Automatic multifunctional enclosure IsoShield™ system which is keeping samples in highly homogenous environment, like uniform temperature field, constant and controllable humidity, negligible level of parasitic electromagnetic fields and electrostatic free staging. The system incorporates an additional safety feature for users that disables the laser beam automatically when the door is open
• Precision Instrument Navigation System PINpoint™ provides easy-to-use navigation allowing precision sample and optical viewing system positioning
• ExpertFBA™ (Expert Fine Beam Alignment System) is a fully automated system for the perfect alignment of the cantilever, laser and photodiode
• Electronic adjustment system of scanning field size ScanScaler™ provides easy-to-manage automatic adjustment of scan mode between large (up to 100 um) and small (atomiс scale) samples
• Automated alignment of optical feedback geometry (cantilever–laser–photodiode)
• Motorized focus and zoom of the optical view
• Automated software driven control of measurement modes
• All basic Atomic Force Microscopy techniques — topography, phase imaging, measurement of electric properties, nanolithography and more
• Scanning Tunneling Microscopy
• Wide range of operating conditions for experimentation — in air or liquid
• Low-noise capacitive closed-loop feedback in all three directions (XYZ) provides precision Nanometrology
• Atomic resolution