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NTEGRA platform: NTEGRA Prima

 
Scanning Probe Microscopy

In air&liquid : AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/ Force Modulation/ Adhesion Force Imaging/ Lithography: AFM (Force) 

In air only: STM/ Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Current), STM/ AFAM (optional)
Specification
Scan type Scanning by sample Scanning by probe*
Sample size

Up to 40 mm in diameter, 
to 15 mm in height

Up to 100 mm in diameter,
up to 15 mm in height

Sample weight

Up to 100 g

Up to 300 g

XY sample positiniong

5x5 mm

Positioning resolution

readable resolution - 5 um
sensitivity - 2 um

Scan range

100x100x10 um
3x3x2,6 um
Less than 1x1x1um

100x100x10 um
50x50x5 um

Up to 200x200x20 um**(DualScanTMmode)

Non linearity, XY
(with closed loop sensors)

0.1%

0.15%

Noise level, Z
(RMS in bandwidth 1000Hz)

With sensors

0.04 nm (typically),
0.06 nm

0.06 nm (typically),
0.07 nm

Without sensors

0.03 nm

0.05 nm

Noise level, XY***
(RMS in bandwidth 200Hz)

With sensors

0.2 nm (typically),
0.3 nm (XY 100 um)

0.1 nm (typically),
0.2 nm (XY 50 um)

Without sensors

0.02 nm (XY 100 um),
0.001 nm (XY 3 um)

0.01 nm (XY 50 um),

Linear dimension estimation error
(with sensors)

±0.5%

±1.2%

Optical viewing system

Optical resolution

1 um
(0.4 um optional, NA 0.7)****

3 um

Field of view

4.5-0.4 mm

2.0-0.4 mm

Continuous zoom

available

available

Vibration isolation

Active

 0.7-1000 Hz

Passive

above 1 kHz

* Scanning head can be configured to serve as a stand-alone device for specimens of unlimited sizes.
** Optionally can be expanded to 200x200x20 мm.
*** Built-in capacitive sensors have extremely low noise and any area down to 50x50 nm can be scanned with closed-loop control.
**** High Resolution Viewing system (HRV head) is optional and provides additional functionality making it possible to generate and detect tip-localized aperture less near-field effects.

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