NTEGRA platform: NTEGRA Solaris
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Scanning Near-Field Microscopy
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| Shear Force Microscopy / SNOM reflection, transmission, luminescence (optional)/ any AFM modes are available optionally |
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Technical characteristics
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| Laser module |
Wavelength* |
441, 488, 514, 532, 633 nm
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| Coupling unit |
X-Y-Z positioner, positioning accuracy 1 um
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V-groove fiber holder
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Coupling 40X objective
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Shear Force Imaging
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| Sample size |
Up to 100 mm in diameter,
up to 15 mm in height
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| XY sample positioning range |
5x5 mm
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| Sample positioning accuracy |
readable resolution - 5 um
sensitivity - 2 um
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| Closed-loop operation |
Capacitive sensors for 3 axes
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Scanning by sample
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Scanning by probe
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| Scan range |
100x100x25 um
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100x100x7 um
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| Non-linearity, XY |
0.03 % (typically)
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<0.15 %
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| Noise level, Z |
<0.2 nm (typically)
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0.04 nm (typically),
 0.06 nm |
| Noise level, XY |
<0.5 nm (typically)
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0.2 nm (typically),
0.3 nm |
| Quartz tuning fork base frequency |
190 kHz
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| Optical fiber diameter |
90 um (for 480-550 nm), 125 um (for 600-680 nm)
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| Aperture diameter |
<100 nm
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| Channels for simultaneous registration |
Reflection
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Transmission/Fluorescence
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PMT detectors
(for each channel) |
Spectral response |
185-850 nm
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| Sensitivity at 420 nm |
3x1010 V/W
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| Current-voltage conversion amplifier (built-in) |
1x106V/A
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| Frequency band width |
20kHz
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| High voltage power supply |
built-in
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Vibration isolation
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Active
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0.7-1000 Hz
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Passive
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above 1 kHz
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* 488 nm laser is included as a default; other lasers can be supplied optionally.
SPM is now 
Get the first 
NT-MDT is ISO 9001:2000 
