NTEGRA platform: NTEGRA Spectra
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NTEGRA Spectra system has
won prestigious R&D 100 Award! |
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Contact
Dr. Pavel Dorozhkin  |
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| Confocal Raman/Fluorescence microscopy |
| Confocal Raman/Fluorescence/Rayleigh imaging runs simultaneously with AFM (during one sample scan) |
| Diffraction limited spatial resolution: <200 nm in XY, <500 nm in Z (with immersion objective) |
| True confocality; motorized confocal pinhole for optimal signal and confocality |
| Motorized variable beam expander/collimator: adjusts diameter and collimation of the laser beam individually for each laser and each objective used |
| Full 3D (XYZ) confocal imaging with powerful image analysis |
| Hyperspectral imaging (recording complete Raman spectrum in every point of 1D, 2D or 3D confocal scan) with further software analysis |
| Optical lithography (vector, raster) |
| AFM/STM: Integration with spectroscopy |
Upright and Inverted optical AFM configurations (optimized for opaque and transparent samples correspondingly);
side illumination option |
| Highest possible resolution (numerical aperture) optics is used simultaneously with AFM: 0.7 NA for Upright, 1.3–1.4 NA for Inverted |
| AFM/STM and confocal Raman/Fluorescence images are obtained simultaneously (during one scan) |
| All standard SPM imaging modes are supported (>30 modes) — combined with confocal Raman/Fluorescence |
| Low noise AFM/STM (atomic resolution) |
| Vibrations and thermal drifts originating from optical microscope body are minimized due to special design of optical AFM heads |
| Focus track feature: sample always stays in focus due to AFM Z-feedback; high quality confocal images of very rough or inclined samples can be obtained |
| Software |
| Seamless integration of AFM and Raman; all AFM/ Raman/SNOM experiment and further data analysis is performed in one and the same software |
| Powerful analysis of 1D, 2D and 3D hyperspectral images |
| Powerful export to other software (Excel, MatLab, Cytospec etc.) |
| Spectroscopy* |
| Extremely high efficiency 520 mm length spectrometer with 4 motorized gratings |
Visible, UV and IR spectral ranges available
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| Echelle grating with ultrahigh dispersion; spectral resolution: 0.007 nm (< 0.1 1/cm)** |
Up to 3 different detectors can be installed
- TE cooled (down to -100 ºC) CCD camera. EMCCD camera is optional — for ultrafast imaging
- Photon multiplier (PMT) or avalanche photodiode in photon counting mode
- Photon multiplier for fast confocal laser (Rayleigh) imaging
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| Flexible motorized polarization optics in excitation and detection channels, cross-polarized Raman measurements |
| Fully automated switch between different lasers — with a few mouse clicks |
| Scanning Near Field Optical Microscopy (SNOM) |
| Two major SNOM techniques supported: (i) based on quartz fiber probes, (ii) based on silicon cantilever probes |
| All modes supported: Transmission, Collection, Reflection |
| All SNOM signals detected: laser intensity, fluorescence intensity, spectroscopy |
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SNOM lithography (vector, raster)
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Optimized for Tip Enhanced Raman Scattering (TERS) and other tip-related optical techniques
(S-SNOM, TEFS, STM-LE etc.) |
| All existing TERS geometries are available: illumination/ collection from bottom, from top or from side |
| Different SPM techniques and TERS probes can be used: STM, AFM cantilever, quartz tuning fork in tapping and shear force modes |
| Dual scan (for Hot Point Mapping in TERS): scan by sample AND scan by tip / by laser spot |
| Motorized polarization optics to produce optimal polarization for TERS |
AFM-Raman measurements can run in air, in controlled atmosphere or in liquid — all with variable temperature
Some features listed are optional — not included into basic system configuration
* NT-MDT AFM can be integrated with Renishaw inVia or with NT-MDT spectrometer. Specifications are given for the latter. Renishaw specifications can be found at www.renishaw.com/AFM-Raman
** Exact value of spectral resolution highly depends on how “resolution” is defined
