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iPhone application
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NTEGRA platform: NTEGRA Tomo
Scanning probe microscopy
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| in-situ: AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/Force Modulation/ Adhesion Force Imaging/ Magnetic Force Microscopy/ Electrostatic Force Microscopy / Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Force and Current) |
| Sample size |
Up to 8 mm in diameter,
up to 15 mm in height
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| Sample weight |
Up to 10 g
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| Scan range |
50x50x5 um
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| Positioning resolution |
readable resolution - 5 um
sensitivity - 2 um
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| Non-linearity, XY |
<0.15%
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| Noise level, Z (RMS in bandwidth 1000 Hz) |
0.06 nm (typically),  0.07 nm
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| Noise level, XY (RMS in bandwidth 200 Hz) |
0.1 nm (typically),  0.2 nm
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| Vibration isolation |
Dynamic
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Frequency range 0.7 – 1000 Hz
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| Passive
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For frequencies above 1 kHz
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Ultratomy
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| Self locking |
Yes
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Section counter |
Yes
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| Graduation |
±30° graduation
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Feed totalizer |
Yes
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| Clearance angle adjustment |
-2° to 15° with 1°scale
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Count down |
Yes
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| Rocking mode |
Yes
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| Knife holder
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For 6-12 mm knives
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E-W measurement |
Yes
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| Coarse knifemovements |
N-S
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10 mm stepping motor
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Auto trim |
Yes
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| E-W
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25 mm stepping motor
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Specimen advance indicator |
Yes
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| Cutting window |
0.2-15 mm adjustable
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Working distance |
110 mm
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| Cutting speed |
0.05-100 mm/s wheel contr.
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Universal specimen holder |
2pcs.
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| Section thickness |
0-15000 nm wheel contr.
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Flat specimen holder |
1p.
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| FEED / SPEED storage |
5
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Instrument table
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Dimensions
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| Return speeds |
10, 30, 50 mm/s
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Shock-absorbing elements
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| Step control |
0.1-15 мm steps
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