| Specification |
| Measuring system |
| Measuring heads |
AFM and STM (stationary, automatically interchangeable); liquid AFM, and nanosclerometer head (removable, with manual insertion) |
| Available SPM modes |
AFM, STM, nanosclerometry in air environment AFM in liquid environment |
| System of cantilever deflection registration |
automated alignment |
| Sample |
| Size |
up to 20 mm in diameter, up to 10 mm in height |
| Sample weight |
up to 40 g |
| Temperature control |
from RT up to 150o C |
| Scanning system |
| Type of scanning |
by sample |
| Scanning area |
100x100x10 um (with feedback sensors)
3x3x2 um in the high resolution mode |
| Nonlinearity, XY |
0.1 % (with feedback sensors) |
| Resolution |
| Noise XY |
less than 0.3 nm (with feedback sensors) |
| Noise level Z (RMS in the band of 10 -1000 Hz) |
0.03 nm (typically) with feedback sensors
0.02 nm in the high resolution mode |
| System of sample positioning |
| Method |
automated, video monitored |
| Range, XY |
5x5 mm |
| Min. step |
0.3 um |
| Video monitoring system |
| Resolution |
2 um |
| Focus |
motorized |
| Zoom |
continuous |
| Overall dimensions and weight |
| Sizing |
470x210x260 mm |
| Weight |
25 kg |
