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SOLVER platform: SOLVER NEXT

  SOLVER NEXT system has
won prestigious R&D 100 Award!
     
 
     

 
Specification
Measuring system
  Measuring heads AFM and STM (stationary, automatically interchangeable); liquid AFM, and nanosclerometer head (removable, with manual insertion)
  Available SPM modes AFM, STM, nanosclerometry in air environment AFM in liquid environment
  System of cantilever deflection registration automated alignment
Sample
  Size up to 20 mm in diameter, up to 10 mm in height
  Sample weight up to 40 g
  Temperature control from RT up to 150o C
Scanning system
  Type of scanning by sample
  Scanning area 100x100x10 um (with feedback sensors)
3x3x2 um in the high resolution mode
  Nonlinearity, XY 0.1 % (with feedback sensors)
Resolution
  Noise XY less than 0.3 nm (with feedback sensors)
  Noise level Z (RMS in the band of 10 -1000 Hz) 0.03 nm (typically) with feedback sensors
0.02 nm in the high resolution mode
System of sample positioning
  Method automated, video monitored
  Range, XY 5x5 mm
  Min. step 0.3 um
Video monitoring system
  Resolution 2 um
  Focus motorized
  Zoom continuous
Overall dimensions and weight
  Sizing 470x210x260 mm
  Weight 25 kg
SPM is now available
for MAC OS users
Get the first app for Nano
from the iTunes App Store
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