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New developments

22.06.2010 NT-MDT announces a new and highly innovative system: integration of Atomic Force Microscope (AFM) and Micro-X-ray fluorescence module (Micro-XRF). This equipment enhances AFM capability with the addition of chemical identification as an option
15.03.2010 NT-MDT Co. developed a module for operating in the SThM mode
18.02.2010 The unique dual-use development: QCM with dissipation monitoring is able to operate as independent tool, and yet it could be easily integrated with AFM by NT-MDT Company
SPM is now available
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