NT-MDT announces a new and highly innovative system: integration of Atomic Force Microscope (AFM) and Micro-X-ray fluorescence module (Micro-XRF). This equipment enhances AFM capability with the addition of chemical identification as an option
The unique dual-use development: QCM with dissipation monitoring is able to operate as independent tool, and yet it could be easily integrated with AFM by NT-MDT Company
