Revolutionary development from NT-MDT Co.

15.04.2009

NT-MDT new advanced development – a universal controller which supports all kind of SPM designed by our company - gives the freedom of unlimited research capabilities. Use of the most high-end technologies makes possible to increase productivity of data processing. High performance DSP, fast ADC-s and expanded nomenclature of user inputs/outputs dramatically enrich functionality.

With scan range size adjustment control system ScanScaler™ it is easy to get atomic resolution with 100×100 micron scanner.
 
Ultrafast scanning (up to 40 Hz) is provided by a unique algorithm combined feedforward and feedback control. Automatic feedback adjustment algorithm allows to optimize system parameters giving an opportunity even for an entry-level user to align. Predictive control keeping the error minimal is provided by an improved feedforward method of Z-axis control based on feedback error analysis. Such combination increases stability and makes it possible to avoid both unknown and measured disturbances.

New technology exceeds standard approach in speed and quality of obtained images. As scanning speed is essential for observing objects with short lifetime or rapidly varying, almost all samples can be investigated by using the algorithm.

Algorithm allows to study all kinds of samples including gentle objects without causing damage even at high rates.
 
Play ultrafast scanning video of microcircuits.

Scanning rate: 12 Hz Scan size: 50 um/256 lines	Scanning rate: 30 Hz Scan size: 30 um/256 lines	Scanning rate: 30 Hz Scan size: 30 um/512 lines
Scanning rate: 40 Hz Scan size: 10 um/256 lines	Scanning rate: 15 Hz Scan size: 17 um/512 lines	Scanning rate: 40 Hz Scan size: 40 um/256 lines