Application areas

Special application
Scanning probe microscopy provides the opportunity of obtaining images of nanosized objects along with carrying out quantitative measurement of various physical parameters. Nevertheless, the same device can not be adjusted for working with all the possible objects. For example, the cellular objects of biologists are very soft and easily subjected to irreversible destruction. To study this kind of objects one needs “sparing” SPM modes and special “soft” probes as well as special environmental conditions: liquid, atmosphere with high concentration of CO2, etc. Diamond crystals or extra-hard surfaces, on the contrary, are too hard, and the common probes and standard technology are not suitable for studying the most part of their parameters. For some experiments the high vacuum conditions are required, for other the research may be interested in the changes, which happens with the sample during electrochemical transformation, and sometimes tasks demand cooling or heating the sample.

“Special application” section will provide you with information concerning the specialized features of our equipment, which can be included in any model of Solver SPM or NTEGRA Probe NanoLaboratory.

Application notes
To see and download application notes choose an application area and search the article subjects.

Scan gallery
Scan gallery contains a collection of scan images made with a lot of measuring modes of Atomic Force Microscopy, Scanning Tunneling Microscopy and Scanning Near-Filed Optical Microscopy. To see the images choose an application group you wish to view.

Publications
Publication section includes articles made with the use of NT-MDT equipment and accessories. The collection starts from 1991. To find a paper choose an application area, related SPM name or type the key words.