Nanosclerometry and nanoindentation
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Hardness measurement based on the local deformation (indentation and scratching).
Dynamic elasticity modulus measuring in the wide range:
- Young modulus measuring of hard and ultra hard materials
- Young modulus measuring of synthetic polymer materials
- Young modulus measuring of biological objects
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Fig.1 Nanoindentation head
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| Comparison of hardness measurement methods |
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Hardness of sample |
Destruction of sample |
Load limit |
| NTEGRA + Hysitron TriboScope |
Hard and ultra Hard(0.1 – 100 GPA) |
Destructive/nondestructive |
Up to 1N |
| NTEGRA with sclerometry option |
Hard and ultra Hard(1 – 80 GPA) |
Destructive/nondestructive |
Up to 200 mN |
| AFAM |
Soft and hard(10 kPa – 10 GPa) |
Nondestructive |
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| AFM and spectroscopy |
Soft and very soft(1 kPa – 1 GPa) |
Destructive/nondestructive |
Up to 2 mN |
Nanosclerometry – hardness measurement based on the analysis of local deformation (indentation and scratching)
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Putting local deformations (indents and scratches) with diamond tip and subsequent analysis by the surface scanning (SPM investigation) form the basis of measuring of local hardness of the material. Nanosclerometry in NTEGRA nanolaboratory may be implemented in two ways: a more harder one (NTEGRA + Hysitron Triboscope) with load limit to 1N and less harder one (NTEGRA with Nanosclerometry option) with load limit to 200 mN. |
Hardness modulus measuring for the hard and ultra hard materials
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The method is based on the use of piezoresonance probe sensor with fork construction with high bending resistance (~104 N/m), that allows using probes with the rigidity 1000 times more than regular AFM probes. This method is nondestructive and allows carrying out correct measuring of elasticity modulus in the range from 50 to 1000 GPa. The minimal field size is near 200 nm. The method allows measuring elasticity modulus of thin films with thickness of 100-150 nm without substrate influences. In the context of the method it is possible to map surface distribution of elasticity modulus, i.e. obtain SPM images which contrast is based on the local Young modulus differences.
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AFAM elasticity modulus measuring of synthetic polymer materials
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AFAM method allows visualizing (and measure quantitatively, using force spectroscopy) local differences if elasticity of synthetic polymer materials and products made of these materials. In contrast to other SPM methods (phase imaging, force modulation), AFAM gives an opportunity to compare the Young modulus value in the much wider range, and i.e. one may investigate hard and soft materials.
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Elasticity modulus measuring of biological objects
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Analysis of load-deformation dependence allows quantitative determining of elasticity modulus and comparing the value for different parts of the sample. The use of probes with soft bar (rigidity constant 10-2-10-1 N/m) allows investigating soft and very soft samples, e.g. living cells and matters.
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(800 Kb)
