NANOEDUCATOR platform: Technical characteristics

• General information
• Key features
• Technical characteristics
• Applications
• Configurations

Technical characteristics
Scanning system
Scanning	by sample
Scan range XY, μm	better than 100
Scan range Z, μm	better than 10
Min. scanning step	2 Å
RMS deviation of the linear dimensions measurements in XY plane	less than 5%
RMS deviation of the linear dimensions measurements in Z-direction	less than 5%
Resolution
Resolution in XY plane	no more than 50 nm
Resolution in Z-direction	no more than 2 nm
Maximum number of scanning points in X- and Y-directions	1024х1024
Scan non-linearity in XY plane in nm, less	30
Scan non-orthogonality in XY plane in deg, less	5
Scan non-planarity in XY plane in μm, less	500
Drift in XY	no more than 5 Å /sec
Drift in Z-direction	no more than 5 Å /sec
AFM mode	X_Y – 50 nm tipically, up to 10 nm with sharp tip and vibroisolation Z – 3 nm
STM mode	X_Y – 10 nm, Z – 3 nm
Operating systems	Mac OS and Windows XP
Sample
Sample size	diameter up to 12 mm
Sample thickness	up to 5 mm
Possibility of giving voltage across the sample	yes
Mass and overall dimensions
Controller overall dimensions (length x width x height) in mm	260х160х360
Measuring head overall dimensions (length x width x height) in mm	160х160х130
Mass (as a unit) in kg, less	8
Probe characteristics
Material	Tungsten wire D 100 – 150 μm
Tip curvature radius	100 nm
Tip cone angle	20–40°
Tip sharpening availability	up to 10 nm
Probe is grounded
Optical system	CCD camera for visual tip approach control
Compatibility with long focus optical microscope
Service conditions
Supply voltage of alternating current	220(+10/-15%) V
Power consumption	no more than 60 W
Ambient air temperature	20±5 °С
Relative air humidity	no more than 65±15 %
Atmospheric pressure	760±30 mm Hg
Thermal drift	no more than 1 °С per hour
Vibration amplitude in the band of 11000 Hz	no more than 0,5 µm