TITANIUM
AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
 
 

SOLVER Nano



Atomic Force Microscope
for Research & Education.

 
 
Specifications Downloads Accessories Contact
 

AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.
 

Applications
 

Scientific research
 

Solver Nano - AFM for science.

Solver Nano is designed by the NT-MDT team that also created High Performancel Systems like Ntegra, NEXT and Spectra which have been proven in the scientific community through many key publications. 

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.
These capabilities enable all of the basic (http://www.ntmdt.com/spm-principles) AFM techniques in compact SPM design.
 

Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below: :

  1.  Polymers
  2.  Bio objects
  3.  Carbon Materials

The following samples were provided by Customers: Nitrocellulose membrane,  Celgard, Polystyrene Polybutadiene (PS/PBD), Graphene.

  Configuration and experimental setup:
  • Solver Nano with AFM head.
  • CL 100 um piezotube scanner. CL enabled.
  • Digital controller.
  • Active vibration isolation.
  • Results from intermittent contact mode (topography, phase, and amplitude image).



NSC_05/20° whisker cantilever was used which has a spring constant of 13 N/m and a resonance of 210 kHz.

Scanning parameters: 4.0x4.0 um scanning area with 512x512 points, and scanning rate of 1 Hz.
 

Sample: Nitrocellulose membrane.

Intermittent Contact mode results from a Nitrocellulose membrane sample.
 

Topography Topography with section line Cross section profile


Sample: Microporous Polypropylene (PP) Membrane (Celgard),

Intermittent Contact mode results from a Celgard sample;
NSC_05/20° whisker cantilever was used which has a force constant of 13 N/m and resonance of 210 kHz.

Scanning parameters: 20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 3 Hz
 

Topography  Phase Topography with section line Cross section profile


Scanning parameters: 2.5x2.5 um scanning area with 512x512 points, and scanning frequency of 30 Hz
 

Topography  Phase Topography with section line Cross section profile 


Sample: Polystyrene Polybutadiene (PS/PBD).

Intermittent Contact mode results from a phase separated blend of Polystyrene Polybutadiene (PS/PBD).
NSC_05/20° whisker cantilever was used which has a spring constant of 12 N/m and a resonance of 201 kHz.

Scanning parameters:  20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 2.5 Hz.
 

Topography (20x20 um) Phase Topography (5x5 um) Phase


Sample: Long DNA 

It is important to note that all data was collected during an on-site demonstration without any filters applied to adjust the raw data.
Intermittent Contact mode results from long stands of DNA/Mica sample;
NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz.
Topography, amplitude and phase image were recorded simultaneously

Scanning parameters: 2.0x2.0um scanning area with 512x512 points, and scanning rate of 0.8 Hz
 

Topography Phase Amplitude

 

Topography with section line Cross section profile Topography with section line Cross section profile


Sample: Short DNA on Mica 

Intermittent Contact mode results from short strands on DNA/Mica sample.
NSG03 cantilever was used which has a force constant of 2 N/m and resonance of 80 kHz.
Topography and phase images were recorded simultaneously.

Scanning parameters: 1.5x1.5um scanning area with 512x512 points, and scanning frequency of 0.7 Hz.
 

Topography Phase

 

Topography with section line Cross section profile


Sample: Circular DNA on Mica

Intermittent Contact mode results from circular DNA/Mica sample.
NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz.
Topography, amplitude and phase images were recorded simultaneously.

Scanning parameters: 900x900 nm scanning area with 512x512 points, and scanning rate of 0.5 Hz
 

Topography Phase Amplitude

 

Topography with section line Cross section profile


Sample: Graphene on Si substrate 

Topography and surface potential image were recorded simultaneously
NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 90 kHz.
Topography and surface potential  were recorded simultaneously

Scanning parameters: 5.0x5.0um scanning area with 512x512 points, and scanning rate of 1.1 Hz.
 

Topography Topography with section line Cross section profile Surface potential


Metrology control
 

SOLVER Nano for metrology applications.

SOLVER Nano AFM can be used for educational / scientific projects as well as for routine measurements. It can also be used as a metrological tool for the determination of linear dimensions of objects in the nanometer range.
 

Technical requirements for metrology appliocations:

  •  Large field scanner – 100x100 um piezotube scanner.
  •  High level XYZ linearity - < 0.1%
  •  Low noise XY sensor – < 0.3 nm in closed loop, < 0.05 nm open loop
  •  Low noise Z sensor – < 0.04 nm in closed loop, < 0.01 nm open loop
  •  Precision capacitance sensors.
  •  Professional software with the common metrological protocols.
     

Sample: Metrology test sample TDG, period 278 nm.

Signal: Topography.
Scanning parameters: 10.0x10.0 um scanning area with 512x512 points, and scanning rate of 2 Hz
 

    Texture direction, Std    33.750 deg
Texture direction index, Stdi    0.295
Radial Wavelength, Srw    4.998 um
Radial Wavelength Index, Srwi    0.0494
Wavelength    0.277 um
Frequency    3.606 1/um
Function Value    9.806 nm^2
X    2.000 1/um
Y    -3.000 1/um
Angle    -56.309 deg.
Topography FFT Power spectrum with cross section line Metrological protocol


Sample: Metrology test sample TGG, period 3 um

Signal: Topography. 
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning rate of 1 Hz
 
     

Texture direction, Std  -89.030  deg
Texture direction index, Stdi    0.0515
Rad. Wavelength, Srw    2.999 um
Rad. Wavelength Index, Srwi   0.0143
Wavelength   2.999 um
Frequency   0.333 1/um
Function Value  0.0537 nm^2
X   0.333 1/um
Y   -0.000000000000000256 1/um
Angle   0.070 deg.

Topography (3D) Topography (2D) FFT Power spectrum with cross section line Metrological protocol


Sample: Metrology test sample TGZ2, period 3 um, relief height 94 nm. 

Signal: Topography.
Scanning parameters: 60.0x60.0um scanning area with 512x512 points, and scanning frequency of 2 Hz
   

  Texture direction, Std   88.945 deg
Texture direction index, Stdi   0.0421
Rad. Wavelength, Srw   2.999 um
Rad. Wavelength Index, Srwi   0.0167
Wavelength   2.999 um
Frequency   0.333 1/um
Function Value   557.454 nm^2
X   0.333 1/um
Y   
-0.000000000000000256  1/um
Angle  0.000 deg.
Topography Topography Height Histogram FFT Power spectrum with cross section line Metrological protocol


Sample: Metrology test sample TGQ, period 3 um, height 19 nm

Signal: Topography.
Scanning parameters: 60.0x60.0um scanning area with 512x512 points, and scanning rate of 3 Hz
   

Topography (3D)

Topography (2D) Topography Height Histogram

 

 
Texture direction, Std    -89.296 deg
Texture direction index, Stdi    0.150
Rad. Wavelength, Srw    2.999 um
Rad. Wavelength Index, Srwi    0.0571
Wavelength    2.999 um
Frequency    0.333 1/um
Function Value    5.926 nm^2
X    0.333 1/um
Y    -0.000000000000000256 1/um
Angle    0.000 deg.
    Texture direction, Std    -89.296 deg
Texture direction index, Stdi    0.150
Rad. Wavelength, Srw    2.999 um
Rad. Wavelength Index, Srwi    0.0571
Wavelength    2.999 um
Frequency    0.333 1/um
Function Value    2.450 nm^2
X    
-0.000000000000000256 1/um
Y   0.333 1/um
Angle    90.000 deg.
FFT Power spectrum with hor. cross section line Metrological protocol FFT Power spectrum with vert. cross section line Metrological protocol.l

 

Specifications

Atomic Force Microscopy

Contact AFM
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation microscopy
Piezoresponse Force Microscopy

Amplitude modulation AFM
Intermittent contact mode
Phase Imaging mode
Semicontact Error mode
Non-Contact mode
Electrostatic Force Modes
Contact EFM

EFM
Scanning Capacitance Microscopy
Kelvin Probe Force Microscopy

MFM
DC MFM
AC MFM
Dissipation Force Microscopy
  AFM Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

Lithographies
AFM Oxidation Lithography
STM Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing

HD Modes

 

General specs:

Scanner   100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner.
AFM resolution   0.01 nm.
Environments   Air and liquid measurements.
Combined video optical microscopes  
Build in 100x optical USB microscope.
External 500x optical microscope.
Design   Table-top, affordable, robust and user-friendly

 

Scanner    
Scanning field   High voltage regime: 100x100x12 um.
Low voltage regime: 3x3x3 um.
Scanner type       Metrological piezotube XYZ scanner with sensors.
Sensors type   XYZ – ultrafast capacitance sensors.
Sensors noise   Low noise XY sensor: < 0.3 nm.
Metrological Z sensor: < 0.03 nm.
Sensors linearity       Metrological XY sensor: < 0.1%
Metrological Z sensor: < 0.1 %
Overall scanner parameters   100x100x12 um with CL.
Resolution: XY -0.3 nm, Z – 0.03 nm. Linearity: XY - < 0.1%, Z - < 0.1%.
3x3x3 um with OL. Resolution: XY -0.05 nm, Z – 0.01 nm.

Sample
Sample positioning range   12 mm.
Sample positioning resolution   1.5 um.
Sample dimension   up to 1,5” X 1,5” X 1/2”,   35x35x12 mm
Sample weight   up to 100 g.
Approach system type   Z – Stepper Motor
Approach system step size   230 nm.
Approach system speed rate   10 mm per min
Algorithm Gentle approach   Available (probe guaranteed to stop before it touches the sample)

Scanning Heads
AFM head for Si cantilever   Available. All commercial cantilevers can be used
Type of cantilever detection   Laser/Detector Alignment
Probe holders   Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting   Cinematically mount. Mount accuracy 150 nm. (Remove/mount accuracy)
STM AFM head for wire probes   Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements.
Type of cantilever detection   Piezo for AFM measurement.
Probe holders   Probe holder for air and liquid measurements.

Controllers. Digital professional controller
Number of images can be acquired during one scanning cycle   Up to 16
Image size   Up to 8Kx8K scan size
ADC   500 kHz 16-bit ADC
12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
Individual filter on each channel
DSP   Floating point 320MHz DSP
Digital FB   Yes 6 Channels
DACs:   4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
2 16-bit DAC for user output
XYZ scanner control voltage   High-voltage outputs: X, -X, Y, -Y, Z, -Z at -150 V to +150 V
Low-voltage mode XY ± 10 V
XY RMS noise in 1000 Hz bandwidth   0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth   0.3 ppm RMS
XY bandwidth   4 kHz (LV regime – 10 kHz)
Z bandwidth   9 kHz
Maximal current of XY amplifiers   1.5 mA
Maximal current of Z amplifiers   8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors      Yes
Open/Closed-loop mode for X,Y controlх   Yes
Generator frequency setting range   DC – 5 MHz
Deflection registration channel bandwidth   170 Hz-5 MHz
Lateral Force registration channel bandwidth   170 Hz -5 MHz
2 additional registration channel bandwidth   170 Hz -5 MHz
Bias Voltage   ± 10 V bandwidth 0 – 5 MHz
Modulating signals supply   To the probe (external output);
High-voltage X,Y, Z channels (including LV regime);
Bias Voltage.
Number of generators for modulation, user accessible   2,  0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs   Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs   6
Additional digital outputs   1
I2C bus   Yes
    Macro language
Max. cable length between the controller and SPM base or measuring heads   2 m
Computer interface   USB 2.0
Voltage supply   110/220 V
Power consumption   ≤ 110 W

 

Software for SPM operation and Data processing.
Software written by programmers NT-MDT and specialized management probe microscopes and associated devices (external and build-in) and also signal and image processing obtained with SPM. This software is used to manage all SPM from NT-MDT, but adapted for each model (Next, Ntegra, Solver Nano). In the case of use with Solver Nano, the software interface as much as possible easy and user-friendly.
 

Operation Interface

Laser alignment

Resonance

Approach

Scan

Curves

Lithography

Tools

Data Processing and Analysis
Data presentation

Data Management

Tools

Data Processing

Data Analysis

Downloads

Undergraduate student manual

Accessories

   

STM head

STM measuring head for wire probes. 

 
   

STM probe holder

STM holder is used with Universal AFM/STM head. 

 
   

Wire probes tip ething device

Special probe etching (probe sharpening) device  for making STM probes from tungsten wire.

 

Contact

 
 
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