| 05.08.2010 |
Traditional Contest of SPM-images obtained with NT-MDT probes starts! |
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| 22.06.2010 |
NT-MDT announces a new and highly innovative system: integration of Atomic Force Microscope (AFM) and Micro-X-ray fluorescence module (Micro-XRF). This equipment enhances AFM capability with the addition of chemical identification as an option |
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| 15.03.2010 |
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images |
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| 18.02.2010 |
The unique dual-use development: QCM with dissipation monitoring is able to operate as independent tool, and yet it could be easily integrated with AFM by NT-MDT Company |
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| 01.02.2010 |
The ProIMAGE Contest, held by NT-MDT Co. in June-December 2009, has been successfully completed. The participants from all over the world submitted the images obtained with NT-MDT probes. Every month NT-MDT Co. experts chose the winner from top-10 images and rewarded him with $1000 certificate. |
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| 25.01.2010 |
In accordance with the market research of the Future Market Inc. Agency, the NT-MDT is the second-largest company on the international market of nanotech equipment in the scanning probe microscopy segment |
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| 20.01.2010 |
The innovative project of Nanoeducation held by the Russian Government follows up. Under the contract of the Ministry of Education and Science 96 school classrooms in the Russian Federation will be equipped with the sets of training Scanning Probe Microscopes NANOEDUCATOR. |
