Attachment for measurements with atomic scale resolution

Attachment for measurements

Attachment for measurements with atomic scale resolution is designed to be used with SPM scanning head. Atomic scale resolution is obtained due to the increase of probe-sample system rigidity and resonance frequency by considerable lowering the size of a mechanical loop achieved owing to a sample is mounted in close proximity to the probe.
Decrease of the size of the mechanical loop is also resulted in lower level of thermal drifts of the system. Moreover, the system is not so sensitive to exterior vibrations and demands minimal vibroisolation. This enables not to use special antivibrating devices.
Design flexibility of the attachment is allowed to obtain owing to the SPM heads with large scanning field the atomic scale resolution.

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