Base for large samples

 

Fig.1 Base for large samples



Fig. 2 Measuring head on the base for large samples
 

Large-scale objects under study impose constraints on SPM measurement capability. The special base, perfectly suited to the mounting and microscopic analysis of non-standard oversize samples, was developed for this problem solving.
The SPM is simply placed on the base for large samples. Due to the base, scanning point position can be located up to 150 mm from the sample edge.
The base is allowed to attach the measuring heads, intended for conducting a study in the different fields of science.

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